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74LVQ373
OCTAL D-TYPE LATCH WITH 3 STATE OUTPUTS NON INVERTING
s s s
s s
s
s s
s
s
s
HIGH SPEED: tPD = 6 ns (TYP.) at VCC = 3.3V COMPATIBLE WITH TTL OUTPUTS LOW POWER DISSIPATION: ICC = 4 A (MAX.) at TA = 25 oC LOW NOISE: VOLP = 0.4V (TYP.) at VCC = 3.3V 75 TRANSMISSION LINE OUTPUT DRIVE CAPABILITY SYMMETRICAL OUTPUT IMPEDANCE: |IOH| = IOL = 12 mA (MIN) PCI BUS LEVELS GUARANTEED AT 24mA BALANCED PROPAGATION DELAYS: tPLH tPHL OPERATING VOLTAGE RANGE: VCC (OPR) = 2V to 3.6V (1.2VData Retention) PIN AND FUNCTION COMPATIBLE WITH 74 SERIES 373 IMPROVED LATCH-UP IMMUNITY
M (Micro Package)
T (TSSOP Package)
ORDER CODES : 74LVQ373M 74LVQ373T input (OE). While the LE input is held at a high level, the Q outputs will follow the data input precisely. When the LE is taken low, the Q outputs will be latched precisely at the logic level of D input data. While the (OE) input is low, the 8 outputs will be in a normal logic state (high or low logic level) and while high level the outputs will be in a high impedance state. It has better speed performance at 3.3V than 5V LS-TTL family combined with the true CMOS low power consuption. All inputs and outputs are equipped with protection circuits against static discharge, giving them 2KV ESD immunity and transient excess voltage.
DESCRIPTION The LVQ373 is a low voltage CMOS OCTAL D-TYPE LATCH with 3 STATE OUTPUTS NON INVERTING fabricated with sub-micron silicon gate and double-layer metal wiring C2MOS technology. It is ideal for low power and low noise 3.3V applications. These 8 bit D-Type latchs are controlled by a latch enable input (LE) and an output enable PIN CONNECTION AND IEC LOGIC SYMBOLS
February 1999
1/10
74LVQ373
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN No 1 2, 5, 6, 9, 12, 15, 17, 18 3, 4, 7, 8, 13, 14, 17, 18 11 10 20 SYMBOL OE D0 to D7 NAME AND FUNCT ION 3 State Output Enable Input (Active LOW) Data Inputs
Q0 to Q7
3 State Outputs
LE GND VCC
Latch Enable Input Ground (0V) Positive Supply Voltage
TRUTH TABLE
INPUT S OE H L L L LE X L H H D X X L H OUTPUTS Q Z NO CHANGE * L H
X: Don't care Z: High impedance * Q output are latched at the timewhen the LE input is taken low logic level.
LOGIC DIAGRAM
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74LVQ373
ABSOLUTE MAXIMUM RATINGS
Symbol VCC VI VO IIK IOK IO Tstg TL Supply Voltage DC Input Voltage DC Output Voltage DC Input Diode Current DC Output Diode Current DC Output Current Storage Temperature Lead Temperature (10 sec) Parameter Value -0.5 to +7 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 50 400 -65 to +150 300 Unit V V V mA mA mA mA
o o
ICC or IGND DC VCC or Ground Current
C C
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is not implied.
RECOMMENDED OPERATING CONDITIONS
Symbol VCC VI VO Top tr, tf Input Voltage Output Voltage Operating Temperature: Input Rise and Fall Time (VCC = 3V) (note 2) Parameter Supply Voltage (note 1) Valu e 2 to 3.6 0 to VCC 0 to VCC -40 to +85 0 to 10 Unit V V V
o
C
ns/V
1) Truth Table guaranteed: 1.2V to 3.6V 2) VIN from 0.8V to 2V
3/10
74LVQ373
DC SPECIFICATIONS
Symb ol Parameter V CC (V) VIH VIL VOH High Level Input Voltage Low Level Input Voltage High Level Output Voltage Low Level Output Voltage Input Leakage Current 3 State Output Leakage Current Quiescent Supply Current Dynamic Output Current (note 1, 2) 3.0 to 3.6 3.0 VI = V IH or V IL VI(*) = VIH or VIL
(* )
Test Co nditions Min. 2.0 T yp.
Valu e T A = 25 oC Max. 0.8 -40 to 85 o C Min. 2.0 0.8 2.9 2.48 2.2 0.002 0 0.1 0.36 0.1 0.25 4 36 -25 0.1 0.44 0.55 1 2.5 40 2.99 Max.
Un it
V V V
I O =-50 A IO=-12 mA IO=-24 mA IO=50 A IO=12 mA IO=24 mA
2.9 2.58
VOL
3.0
V A A A mA mA
II IOZ ICC IOLD IOHD
3.6 3.6 3.6 3.6
VI = VCC or GND VI = VIH or VIL VO = VCC or GND VI = VCC or GND VOLD = 0.8 V max VOHD = 2 V min
1) Maximum test duration 2ms, one output loaded attime 2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50 . (*) All outputs loaded.
DYNAMIC SWITCHING CHARACTERISTICS
Symb ol Parameter V CC (V) VOLP VOLV VIHD VILD Dynamic Low Voltage Quiet Output (note 1, 2) Dynamic High Voltage Input (note 1, 3) Dynamic Low Voltage Input (note 1, 3) 3.3 -0.8 3.3 3.3 C L = 50 pF 0.8 Test Co nditions Min. T yp. 0.4 -0.5 2 V Valu e T A = 25 oC Max. 0.8 -40 to 85 o C Min. Max. Un it
1) Worst case package 2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n -1) outputs switching and one output at GND 3) max number of data inputs (n) switching. (n-1) switching 0V to3.3V. Inputs under test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD). f=1MHz
4/10
74LVQ373
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = tf =3 ns)
Symb ol Parameter V CC (V) tPLH tPHL tPLH tPHL tPLZ tPHZ tPZL tPZH tw tsL tsH thL thH tOSLH tOSHL Propagation Delay Time LE to Q Propagation Delay Time D to Q Output Disable Time Output Enable Time LE pulse Width, HIGH Setup Time D to LE HIGH or LOW Hold Time D to LE HIGH or LOW Output to Output Skew Time (note 1, 2) 2.7 3.3(*) 2.7 3.3(*) 2.7 3.3(*) 2.7 3.3(*) 2.7 3.3(*) 2.7 3.3
(*)
T est Con ditio n
Valu e T A = 25 oC -40 to 85 o C Min. T yp. Max. Min. Max. 8.0 17.0 18.0 6.5 7.5 6.0 8.5 7.0 9.0 7.0 2.0 1.5 0.0 0.0 0.0 0.0 0.5 0.5 11.0 15.0 10.0 20.0 14.0 18.0 12.0 5.0 4.0 3.0 2.0 1.5 1.5 1.0 1.0 12.0 16.0 11.0 21.0 15.0 19.0 13.0 6.0 4.0 4.0 3.0 2.0 2.0 1.5 1.5
Un it
ns ns ns ns ns ns ns ns
2.7 3.3(*) 2.7 3.3(*)
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any twooutputs of the same device switching in the same direction, either HIGH or LOW (tOSLH = |tPLHm - tPLHn|, tOSHL = |tPHLm - tpHLn|) 2) Parameter guaranteed by design (*) Voltage range is 3.3V 0.3V
CAPACITIVE CHARACTERISTICS
Symb ol Parameter V CC (V) C IN COUT CPD Input Capacitance Output Capacitance Power Dissipation Capacitance (note 1) 3.3 3.3 3.3 fIN = 10 MHz Test Co nditions
o
Valu e T A = 25 C Min. T yp. 5 10 10 Max. -40 to 85 C Min. Max.
o
Un it
pF pF pF
1) CPD isdefined as the value of the IC'sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD * VCC * fIN + ICC/8(per Latch)
5/10
74LVQ373
TEST CIRCUIT
T EST tPLH , tPHL tPZL , tPLZ tPZH , tPHZ
CL = 50 pF or equivalent (includes jigand probe capacitance) RL = R1 = 500 orequivalent RT = ZOUT of pulse generator (typically 50)
SW IT CH Open 2VCC Open
WAVEFORM 1: LE TO Qn PROPAGATION DELAYS, LE MINIMUM PULSE WIDTH, Dn TO LE SETUP AND HOLD TIMES (f=1MHz; 50% duty cycle)
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74LVQ373
WAVEFORM 2: OUTPUT ENABLE AND DISABLE TIMES (f=1MHz; 50% duty cycle)
WAVEFORM 3: Dn TO Qn PROPAGATION DELAY TIME (f=1MHz; 50% duty cycle)
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74LVQ373
SO-20 MECHANICAL DATA
DIM. MIN. A a1 a2 b b1 C c1 D E e e3 F L M S 7.40 0.50 12.60 10.00 1.27 11.43 7.60 1.27 0.75 8 (max.) 0.291 0.19 13.00 10.65 0.35 0.23 0.50 45 (typ.) 0.496 0.393 0.050 0.450 0.299 0.050 0.029 0.512 0.419 0.10 mm TYP. MAX. 2.65 0.20 2.45 0.49 0.32 0.013 0.009 0.020 0.004 MIN. inch TYP. MAX. 0.104 0.007 0.096 0.019 0.012
P013L
8/10
74LVQ373
TSSOP20 MECHANICAL DATA
mm MIN. A A1 A2 b c D E E1 e K L 0o 0.50 0.05 0.85 0.19 0.09 6.4 6.25 4.3 6.5 6.4 4.4 0.65 BSC 4o 0.60 8o 0.70 0o 0.020 0.10 0.9 TYP. MAX. 1.1 0.15 0.95 0.30 0.2 6.6 6.5 4.48 0.002 0.335 0.0075 0.0035 0.252 0.246 0.169 0.256 0.252 0.173 0.0256 BSC 4o 0.024 8o 0.028 0.004 0.354 MIN. inch TYP. MAX. 0.433 0.006 0.374 0.0118 0.0079 0.260 0.256 0.176
DIM.
A
A2 A1 b e K c L E
D
E1
PIN 1 IDENTIFICATION
1
9/10
74LVQ373
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a trademark of STMicroelectronics (c) 1999 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A. http://www.st.com .
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